Dear Value Customers; Happy Chinese New Year and Gong Xi Fa Cai! We would to say THANK YOU for your support and trust though the years. We’re looking forward to serve you better in 2026! Our office will be close from 14 Feb 2026 - 19 Feb 2025 during the Chinese New Year. Last but not at least, we ATOMIC would like to wish all you stay safe, healthy and prosperous in year of 2026! Warmest Regard Atomic Solutions read more

We are excited to announce the launch of our next-generation system — upgrading from the G2 to the Phenom XL G3. Key Highlights: Longer Source Lifetime – up to 3000 hours and more (double the G2): dramatically reduced maintenance downtime, lower operating costs, and significantly higher ROI. New BSE Detector: superior material contrast, improved compositional analysis, and better signal-to-noise ratio. Improved Resolution: enhanced from <10 nm to <9 nm for sharper, more precise imaging. With these major advancements, the Phenom XL G3 sets a new benchmark — empowering researchers, scientists, and industry professionals to achieve more accurate results and smarter decisions. Feel free to contact us for more details! Atomic Solutions read more

Dear VIPs; We are exhbiting the Johor Industrial Fair 2025 at Persada Johor International Convention Centre Johor from 27 - 29 August 2025. Freel free to visit us for FREE sample eval with SEM-EDX, Optical Microscope and XRF. Regards Atomic read more

Dear All; Feel free to join our workshop! The workshop offers a full-day technical session focused on advanced characterization techniques supporting clean energy innovation, featuring Thermo Fisher Scientific technologies. The program includes expert-led presentations and live demonstrations of cutting-edge analysis tools such as SEM, FIB and XPS. Participants will gain valuable insights into high-resolution imaging, precise surface and subsurface analysis, and comprehensive materials characterization workflows essential for advancing clean energy research and applications. Regards Atomic Solutions read more

Hi; We are exhibiting at IPFA on coming  5 - 8 August 2025 Spice Convention Centre Penang. Feel free to drop by for FREE SEM-EDX, 3D Microscope and XRF demo! Regards Atomic Solutions read more

Description: The PDL‑1000 is a compact, tabletop Hall measurement system designed for both AC and DC modes. It delivers high-sensitivity analysis of sheet resistance, carrier concentration, and mobility—even in low‑mobility or semi‑insulating samples—across a wide dynamic range using patented Parallel Dipole Line technology and software-based lock‑in detection. Features: User-friendly operation Compact tabletop system design No cooling system necessary Uniformity (< 2% sample size up to 10×10 mm) Large magnetic field (approximately 2,5 T pk-pk) High sensitivity (able to handle mobility less than 0.1 cm2/Vs) Application: Parallel Dipole Line Hall Measurement Ideal for characterizing semiconductor, photovoltaic, and thermoelectric materials, the PDL Hall system excels in analyzing low-mobility samples with high precision. Its AC field mode enables accurate measurement of electrical properties such as mobility, carrier concentration, and sheet resistance, even in semi insulating or complex thin-film structures.         DL Hall system is capable of measuring several materials, like semiconductors, compound materials (III-V, II-VI), solar cells, transparent conductive oxides (TCOs) and organics electronics (OTFT, OLED) with very high sensitivity.   read more

Description:   The DLS‑1100 is Semilab’s most sensitive deep‑level transient spectrometer, tailored for industrial quality control and advanced R&D. Featuring a low‑vibration cryostat, enhanced temperature control, and automatic data acquisition software, it detects electrically active defects and impurities down to ~5×10⁷ atoms/cm³ with minimal user input.   Features: Ultra-high sensitivity detection Low-vibration cryostat Precise temperature control Fully automated operation Multiple measurement modes WinDLS software with built-in trap database Application: Parallel Dipole Line Hall Measurement The DLS‑1100 uses advanced Deep Level Transient Spectroscopy (DLTS) to identify and quantify electrically active impurities and defects in semiconductor materials. By analyzing activation energy and capture cross-section, it helps trace contamination sources and process-related defects, enabling manufacturers to improve material quality and optimize production—down to ultra-low impurity levels.        read more