X-ray

Description

Detailed capture and measurement of internal component and assembly features is often vital for quality control, failure analysis and material research. The systems offer microfocus X-ray source with high image resolution.

· X-ray inspection system that facilitates real-time imaging and defect analysis of next-generation wafer-level, semiconductor device and PCBA applications · Large measurement area · Intuitive joystick navigation drives real-time X-ray imaging · Safety as a design criterion · specifically designed for x-ray inspection in production