Description:

SE-1000 provides modularity and high measurement performance in a compact table top footprint. This cost-efficient tool includes manual goniometer and manual sample positioning suitable for R&D laboratories. It performs non-contact and non-destructive optical measurements on substrates, single layer and multi-layer samples to obtain individual thin film thickness and optical properties. SE-1000 includes Semilab’s new smart electronics with interchangeable components, and operates with the new generation operating and analysis software (SAM / SEA). The system can be controlled from a PC or laptop through LAN network, or by a new touch panel.
 

Features:

1. Broad Spectral Range
2. High Precision Optics
3. Non-Destructive Testing
4. Modular & Scalable Design
5. Microspot Capability
6. Advanced Software

Measurement modes:

• Spectroscopic Ellipsometry with rotating compensator
• Generalized Ellipsometry for anisotropic samples
• Mueller matrix 11 coefficients
• Jones matrix
• Porosimetry: Measurements of pore size distribution and porosity in thin films
• In situ measurement mode for real time control during deposition or etch process

Application