33-01, Jalan Sagu 18,
Taman Daya,
81100 Johor Bahru,
Johor, Malaysia.
+6010-820 9965
+6018-989 9965
+6018-989 9965
+607-362 1965
+60189899965
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Atomic Solutions Sdn Bhd
33-01, Jalan Sagu 18,
Taman Daya,
81100 Johor Bahru,
Johor, Malaysia.
33-01, Jalan Sagu 18,
Taman Daya,
81100 Johor Bahru,
Johor, Malaysia.
Kuala Lumpur Branch
21-3, Dataran Mutiara, Jalan 7/4, Taman Serdang Jaya, 43300 Seri Kembangan, Selangor, Malaysia.
+6018-989 9965
Penang Branch
8, 1st Floor, Tingkat Bukit Minyak 9, Taman Bukit Minyak, 14000 Bukit Mertajam, Pulau Pinang, Malaysia.
+6017-466 0195
+6018-989 9965
21-3, Dataran Mutiara, Jalan 7/4, Taman Serdang Jaya, 43300 Seri Kembangan, Selangor, Malaysia.
+6018-989 9965
+607-362 1965
Penang Branch
8, 1st Floor, Tingkat Bukit Minyak 9, Taman Bukit Minyak, 14000 Bukit Mertajam, Pulau Pinang, Malaysia.
+6017-466 0195
+6018-989 9965
+607-362 1965
OstecNIOS
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Description
The technologies underlying NIOS nanomechanical instruments have been developed by russian materials scientists and engineers since 1995. All technical solutions employed on NIOS instruments are protected by patents under Russian Federation.
The technologies underlying NIOS nanomechanical instruments have been developed by russian materials scientists and engineers since 1995. All technical solutions employed on NIOS instruments are protected by patents under Russian Federation.
NIOS Advanced is the flagship model, which implements more than 30 different measuring techniques covering the product line widest range of physical and mechanical properties measurements at the submicron and nanometer scale.
All NIOS measurements are performed in an open environment (i.e. without the use of special vacuum or heat treatment). NIOS instruments are designed with features and functionalities that allows its use for research and industrial applications.
Feature
- Automation of measurements (including scripting command language and batch data processing)
- Flexible instrument configuration according to the customer’s tasks and budget
- Wide range of methods supplied with default instrument configurations
- Wide range of loads and displacements in single head
Application