The technologies underlying NIOS nanomechanical instruments have been developed by russian materials scientists and engineers since 1995. All technical solutions employed on NIOS instruments are protected by patents under Russian Federation.
NIOS Advanced is the flagship model, which implements more than 30 different measuring techniques covering the product line widest range of physical and mechanical properties measurements at the submicron and nanometer scale.
All NIOS measurements are performed in an open environment (i.e. without the use of special vacuum or heat treatment). NIOS instruments are designed with features and functionalities that allows its use for research and industrial applications.
Feature
Automation of measurements (including scripting command language and batch data processing)
Flexible instrument configuration according to the customer’s tasks and budget
Wide range of methods supplied with default instrument configurations
Wide range of loads and displacements in single head