Microscope

Description

A combination of high-technology and creativity, the Motic PA53-MET series offers superior optical performance as well as an advanced ergonomic design, futuristic digital capabilities, and innovative modules. Motic PA53-MET: Your ultimate metallurgical Optical Solution.

Description

The all new VIS100/VIS200 series, a product by Motic for the industrial field, performs an online or offline probe application, visualization, inspection, observation, measurement, and documentation via monitor or LCD display.

Description

Motic Scientific’s PA80MET and PA120MET series microscopes feature a flexible, modular design that can be suited to your specific industrial inspection application.

Description

Inverted metallurgical microscope for the inspection of bulky samples in automotive-, machinery- and steel industry. Large metal pieces and die casting parts, too large for an upright microscope are easily examined to perform failure analysis, material research and quality control. The instrument comes without objectives to be individually equipped.

Multipurpose, low-damage cutting for all specimen types

Description:

The PELCO® Precision Low Speed Saw is a compact, multipurpose, precision saw designed to cut a wide variety of materials with minimal subsurface damage.

Description

Motic’s SMZ-171 is an advanced stereo microscope for a wide range of biomedical and material science applications. The Greenough system delivers crisp and clear images in a zoom range of 6.7:1. Five click-stops within the smooth zoom allow a precise reproduction of defined magnifications.

Description:

Motic Images Plus series is not only for schools or small laboratories but also industrial clients who look for simple budget in mind and do not need printing to the specialists looking for the tiniest details for documentation and printing purpose.

Sample Preparation Tool for Powders Application stubs SEM and Microscopy

With the Thermo Scientific™ Nebula™ Particle Dispenser, a standard method for uniform dry powder dispersion on SEM stubs becomes available.